Gnomit / Keyword Search / Info
Gnomit ? ? ?
Results 1 - 3 of 3 for:
reflectometer
1
ellipsometry
1 ?
 21,213,375 websites (safe search)

  1. Axic Inc - Semiconductor Plasma, Rapid Thermal Processing and Thin Film Metrology Equipment Company Homepage

    AXIC, Inc manufactures and distributes semiconductor plasma processing equipment and Thin Film Metrology tools (Ellipsometer, Spectroscopic and Discrete ...
    Asher1
    PECVD1
    Thickness Measurement1
    Plasma etcher1
    refractive index1
    Reflectometer1
    ellipsometer1
    optical measurement1
    LPCVD1
    ellipsometry1
    Plasma etch1
    Spectroscopic Ellipsometry1
    Thin Film Measurement1
    Spectroscopic Ellipsometer1
    Thin Film Metrology1
    Photoresist stripping1
    Reactive ion etch1
    Plasma deposition1
    Rapid thermal annealing1
    Reactive ion etcher1
    Thin Film Analysis1
    Rapid thermal anneal1
    Resist stripper1
    X-ray fluoresence1
    Diode etcher0
    ICP etch0
    ICP etcher0
    ICP PECVD0
    Photoresist stripper0
    Plasma wafer backside thinning0
    Rapid thermal processor0

    www.axic.com - 2009-02-07

  2. Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with ...

    Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the ...
    index3
    SCI2
    metrology2
    thin film1
    thickness1
    film thickness1
    reflectometer1
    ellipsometer1
    roughness1
    spectrophotometry1
    ellipsometry1
    material analysis1
    optical properties1
    ellipsometers1
    spectroscopic ellipsometry1
    material characterization1
    reflectometry1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    film thickness measurement1
    multiwavelength ellipsometer1
    thin film metrology1
    reflectometers1
    extinction coefficient1
    crystallinity1
    metrology tools1
    multi angle reflectometer1
    spectroscopic reflectometer1
    spectroscopic reflectometry1
    thin film metrology tools0

    www.sci-soft.com - 2009-02-07

  3. Scientific Computing International - FilmTek Instruments

    FilmTek™ 2000SE - Spectroscopic Ellipsometer. Based on a rotating compensator design, the FilmTek™ 2000SE combines spectroscopic ellipsometry with normal inc ...
    index3
    SCI2
    metrology2
    thin film1
    thickness1
    spectrophotometer1
    film thickness1
    reflectometer1
    ellipsometer1
    roughness1
    spectrophotometry1
    ellipsometry1
    material analysis1
    optical properties1
    ellipsometers1
    spectroscopic ellipsometry1
    material characterization1
    reflectometry1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    film thickness measurement1
    multiwavelength ellipsometer1
    thin film metrology1
    reflectometers1
    extinction coefficient1
    crystallinity1
    metrology tools1
    multi angle reflectometer1
    spectroscopic reflectometer1
    spectroscopic reflectometry1

    www.sciinstruments.com - 2009-02-07

About Gnomit
Keywords may contain spaces.
Separate multiple keywords with commas.
Start a new search.
Enter new keyword(s).
Narrow down your search.
Add keyword(s).
Broaden your search.
Click on Keyword to remove from query.