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  1. Mirolux Products, Inc.

    Mirolux Products, Inc. Retroreflectometer Manufacturer
    reflectometer1
    retroreflectometer1
    mirolux1

    www.miroluxproducts.com - 2009-02-06

  2. Axic Inc - Semiconductor Plasma, Rapid Thermal Processing and Thin Film Metrology Equipment Company Homepage

    AXIC, Inc manufactures and distributes semiconductor plasma processing equipment and Thin Film Metrology tools (Ellipsometer, Spectroscopic and Discrete ...
    Asher1
    PECVD1
    Thickness Measurement1
    Plasma etcher1
    refractive index1
    Reflectometer1
    ellipsometer1
    optical measurement1
    LPCVD1
    ellipsometry1
    Plasma etch1
    Spectroscopic Ellipsometry1
    Thin Film Measurement1
    Spectroscopic Ellipsometer1
    Thin Film Metrology1
    Photoresist stripping1
    Reactive ion etch1
    Plasma deposition1
    Rapid thermal annealing1
    Reactive ion etcher1
    Thin Film Analysis1
    Rapid thermal anneal1
    Resist stripper1
    X-ray fluoresence1
    Diode etcher0
    ICP etch0
    ICP etcher0
    ICP PECVD0
    Photoresist stripper0
    Plasma wafer backside thinning0
    Rapid thermal processor0

    www.axic.com - 2009-02-07

  3. JWM ENGINEERING GROUP, INC

    Top quality Products and Consulting Services
    Consulting Services2
    PLL1
    Reflectometer1
    Microwave Products1
    Phase Locked Oscillator1
    RF-Analog-Digital Design0
    R Sequencer0

    www.jwmeng.com - 2009-02-07

  4. Mastrad Quality and Test Systems

    Mastrad is a leading worldwide supplier of Process Technology and manufacturer of Quality and Test Systems and for Petroleum, Asphalt, Highways, Concrete, Soils ...
    RAM2
    Schmidt2
    Blaine1
    Speedy1
    ELE1
    Pundit1
    AAV1
    Protimeter1
    Radiodetection1
    reflectometer1
    Vicat1
    SHRP1
    Erudite1
    Falling Weight Deflectometer1
    Saybolt1
    COLEBRAND1
    Frictiontester1
    Laser Profilometer1
    Retroreflectometer1
    Griptester1
    Protovale1
    SOILTEST1
    ROMDAS1
    Spectraphysics1
    ACV.MCV1
    Aqua-Spear1
    CNS Electronics1
    Footemeter1
    Heavy Weight Deflectometer1
    Retrometer1
    Retrosign1

    www.canin-corrosion.com - 2009-02-06

  5. Surface inspection, windscreen inspection, ornamental stone, metallurgy, marble, fissure detection)

    We design, develop, produce and service measuring instruments aimed at controlling the quality of manufactured products. Our instruments are based on the ...
    transmission2
    marco2
    iris2
    reflection1
    SLI1
    scattering1
    rolling mill1
    glacis1
    reflectometer1
    surface inspection1
    coating inspection1
    ornamental stone1
    scatterometer1
    bottle inspection1
    optical solutions1
    roughness measurement1
    brdf1
    cleanliness of surface1
    transmissometer1
    marble inspection1
    skin pass1
    dimension measurement0
    tiles inspection0
    wear of surface0
    windis0
    windscreen inspection0

    www.dmo.be - 2009-02-08

  6. OTDR

    A leading provider of optical fiber products and services for communication networks including OTDR, equipment manufacturers. We offer variety of different well ...
    term3
    definition2
    glossary2
    meaning1
    define1
    otdr1
    reflectometer1
    otdrs1

    otdrstore.com - 2009-04-09

  7. LTC & DTC Limited ::: Drycleaning & Laundry Technology Centre ::: UK ::: Consultants

    Welcome to the future online-home of DTC & LTC Limited , We offer a wide range of independent services for the Drycleaning and Laundry Industry, both in the UK ...
    Textiles2
    Laundry2
    Washing2
    Dispute resolution2
    Dry Cleaning2
    Technical Training1
    Detergents1
    Drycleaning1
    Technical Consultancy1
    British Standards1
    Reflectometer1
    cleaning standards1
    Ian Harris1
    Laundry Consultancy1
    Textile evaluation1
    drycleaning consultant0
    Richard Neale0
    UK drycleaning0

    www.dtcltc.com - 2009-02-06

  8. Devices and Services Co., manufacturer of solar measurement instruments.

    Devices and Services manufactures instrumentation to measure the solar properties of materials.
    solar3
    reflector1
    reflectance1
    reflectometer1
    soiling1
    transmittance1
    specular1
    solar spectrum1
    absorptance1
    emissometer1
    emittance1
    solar instruments1
    solar reflector1
    specular reflectance1
    Devices and Services0
    reflector soiling0
    solar spectrum reflectometer0
    specular reflectometer0

    www.devicesandservices.com - 2009-02-05

  9. Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with ...

    Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the ...
    index3
    SCI2
    metrology2
    thin film1
    thickness1
    film thickness1
    reflectometer1
    ellipsometer1
    roughness1
    spectrophotometry1
    ellipsometry1
    material analysis1
    optical properties1
    ellipsometers1
    spectroscopic ellipsometry1
    material characterization1
    reflectometry1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    film thickness measurement1
    multiwavelength ellipsometer1
    thin film metrology1
    reflectometers1
    extinction coefficient1
    crystallinity1
    metrology tools1
    multi angle reflectometer1
    spectroscopic reflectometer1
    spectroscopic reflectometry1
    thin film metrology tools0

    www.sci-soft.com - 2009-02-07

  10. Scientific Computing International - FilmTek Instruments

    FilmTek™ 2000SE - Spectroscopic Ellipsometer. Based on a rotating compensator design, the FilmTek™ 2000SE combines spectroscopic ellipsometry with normal inc ...
    index3
    SCI2
    metrology2
    thin film1
    thickness1
    spectrophotometer1
    film thickness1
    reflectometer1
    ellipsometer1
    roughness1
    spectrophotometry1
    ellipsometry1
    material analysis1
    optical properties1
    ellipsometers1
    spectroscopic ellipsometry1
    material characterization1
    reflectometry1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    film thickness measurement1
    multiwavelength ellipsometer1
    thin film metrology1
    reflectometers1
    extinction coefficient1
    crystallinity1
    metrology tools1
    multi angle reflectometer1
    spectroscopic reflectometer1
    spectroscopic reflectometry1

    www.sciinstruments.com - 2009-02-07

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