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  1. Probe Card - Test Sockets - PCB Solutions for Semiconductor Wafer and Device Test by APS

    APS provides Probecards for Wafer Probing, Test Sockets for IC Component Test, and Multilayer PCB for Wafer-, Device- and IC Test
    kelvin socket0
    multi DUT0
    Performance Board0
    rhenium-tungsten0
    strip test socket0
    Synergie CAD0
    tungsten-rhenium0

    www.aps-munich.com - 2009-02-12

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