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  1. LDB Corportation

    The source for precision metrology products, services, and solutions

    www.ldbcorp.com - 2009-02-09
  2. Polytec TopMap Topography Measurement Systems | Scanning white-light interferometers for non-contact surface profile measurements, large area flatness, ...

    Polytec TopMap Topography Measurement Systems | Scanning white-light interferometers for non-contact surface profile measurements, large area flatness, ...
    topography measurement0
    white light interferometer0

    www.topmap.info - 2009-02-12
  3. Profilometer Surface Roughness Measurement | Atomic Force Microscopes| Ambios Technology

    Profilometer surface roughness measurement, Atomic Force Microscope AFM SPM and Scanning Probe Microscopy, Interferometer metrology with Ambios precision ...

    www.ambiostech.com - 2009-02-12

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