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The source for precision metrology products, services, and solutions
www.ldbcorp.com - 2009-02-09
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Polytec TopMap Topography Measurement Systems | Scanning white-light interferometers for non-contact surface profile measurements, large area flatness, ...
topography measurement  white light interferometer 
www.topmap.info - 2009-02-12
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Profilometer surface roughness measurement, Atomic Force Microscope AFM SPM and Scanning Probe Microscopy, Interferometer metrology with Ambios precision ...
www.ambiostech.com - 2009-02-12
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