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  1. BIOPHY - Analyse surface

    Surface analysis specialized company (esca, tof-sims, afm, ftir, contact angle, permeation) and plasma treatments (pecvd)
    sims2
    afm1
    xps1
    force measurement1
    surface treatment1
    morphology1
    ftir1
    permeability1
    pecvd1
    esca1
    surface analysis1
    atomic force microscopy1
    glow discharge1
    roughness1
    permeation1
    phase contrast1
    contact angle1
    infrared analysis1
    nanoindentation1
    tof-sims1
    contamination analysis1
    cold plasma1
    plasma activation1
    tofsims1
    atomic composition0
    biophy0
    biophy research0
    bonding composition0
    molecular fragment0
    rugosity0
    tof sims0

    www.biophyresearch.com - 2009-02-07

  2. Profilometer Surface Roughness Measurement | Atomic Force Microscopes| Ambios Technology

    Profilometer surface roughness measurement, Atomic Force Microscope AFM SPM and Scanning Probe Microscopy, Interferometer metrology with Ambios precision ...
    optical2
    force2
    measurement2
    finish2
    surface2
    microscope2
    atomic2
    microscopes2
    metrology2
    height1
    rms1
    afm1
    spm1
    profiler1
    interferometer1
    flatness1
    profilometer1
    profilers1
    roughness1
    waviness1

    www.ambiostech.com - 2009-02-12

  3. ETCbrunel - Home

    ETCbrunel
    analysis3
    environmental3
    asbestos3
    SEM3
    materials3
    metals2
    biomedical2
    AFM1
    SPM1
    XPS1
    DLC1
    heavy metals1
    thin films1
    particulates1
    roughness1

    www.etcbrunel.co.uk - 2009-02-06

  4. SIS - High Resolution Surface Inspection, SPM, AFM, Microscopy

    Welcome to Surface Imaging Systems For more than 10 years we have been developing atomic force and scanning probe microscopes (AFM / SPM) for the nanotechnology ...
    DVD5
    contact3
    LCD3
    Nikon2
    Olympus2
    resolution2
    tip2
    polymer2
    nanotechnology2
    TFT2
    Leica2
    metrology2
    combination1
    Zeiss1
    hard disk1
    AFM1
    SPM1
    Spitze1
    Sonde1
    Mikroskop1
    interferometer1
    non contact1
    Atomic Force Microscope1
    roughness1
    Scanning Probe Microscopy1
    300 mm1
    Rasterkraftmikroskop1
    step height1
    integrated microscopy0
    intermittent contact0
    Large Sample AFM0

    sis-gmbh.com - 2009-02-06

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