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  1. Profilometer Surface Roughness Measurement | Atomic Force Microscopes| Ambios Technology

    Profilometer surface roughness measurement, Atomic Force Microscope AFM SPM and Scanning Probe Microscopy, Interferometer metrology with Ambios precision ...
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    www.ambiostech.com - 2009-02-12

  2. Herzan - Solutions for the Measuring Environment

    Herzan specializes in solving vibration and acoustic problems for extremely sensitive instruments. This online catalog offers you access to our full product ...
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    Newport Corporation1

    www.activeisolation.com - 2009-02-14

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