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  1. Profilometer Surface Roughness Measurement | Atomic Force Microscopes| Ambios Technology

    Profilometer surface roughness measurement, Atomic Force Microscope AFM SPM and Scanning Probe Microscopy, Interferometer metrology with Ambios precision ...
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    www.ambiostech.com - 2009-02-12

  2. PhaseView - The Digital Wavefront Company

    PhaseView's non contact metrology instruments use Digital Phase Technology for 3D surface measurement, surface texture assessment, profilometry, roughness ...
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    phaseview.com - 2009-02-10

  3. FOGALE nanotech - Semiconductor Metrology Solutions - Wafer surface / dimensional metrology...

    Semiconductor Metrology Solutions Home Company > History > Contact > Driving direction Products > ALL PRODUCTS > 3D profilers series > Non contact dimensional ...
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    www.fogale-semicon.com - 2009-02-11

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