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    The US manufacturer High Quality AFM Probes, SPM Probes, Probe Tips, MFM probes, EFM Probes, Contact Mode Probes, Non-contact Mode Probes, Silicon Probes, ...
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    www.appnano.com - 2009-02-07

  2. Profilometer Surface Roughness Measurement | Atomic Force Microscopes| Ambios Technology

    Profilometer surface roughness measurement, Atomic Force Microscope AFM SPM and Scanning Probe Microscopy, Interferometer metrology with Ambios precision ...
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    www.ambiostech.com - 2009-02-12

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