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Profilometer surface roughness measurement, Atomic Force Microscope AFM SPM and Scanning Probe Microscopy, Interferometer metrology with Ambios precision ...
www.ambiostech.com - 2009-02-12
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PhaseView's non contact metrology instruments use Digital Phase Technology for 3D surface measurement, surface texture assessment, profilometry, roughness ...
phaseview.com - 2009-02-10
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