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  1. Extensive line of optical instruments offered by Graham Optical Systems

    Graham Optical Systems, manufacturers of visibile wvelength and infrared phase fizeau interferometers, infrared interferometers, grazing-incidence ...
    Dual2
    measuring2
    phase1
    grazing1
    Interferometer1
    Wavelength1
    interferometry1
    incidence1
    surface measurement1
    non-contact measurement1
    interferometers1
    flatness measurement1
    reflectometers1
    optical design service1
    prototype service1
    transmissometers1
    zoom lens design1
    custom interferometers1
    customized instruments1
    fizeau interferometer1
    1.06 micron interferometers0
    1.55 micron interferometers0
    3.39 micron interferometers0
    Fizeau Interferometers0
    infrared interferometers0
    matte surface measurement0
    phase-shifting interferometers0

    www.grahamoptical.com - 2009-02-05

  2. MultiCPM - Simultaneous Real Time Multi-Chamber - Multi diagnosis monitor

    The MULTISEM design concept is based on an open parallel architecture consisting of a central supervisor control unit, and a network of analytical substations
    plasma2
    etch1
    OES1
    Sofie1
    endpoint1
    interferometry1
    Horiba1
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    plasma etch1
    Jobin Yvon1
    end point1
    dry etching1
    optical emission1
    optical emission spectroscopy1
    dry etch1
    thin film characterisation1
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    plasma monitoring1
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    plasma characterization1
    thin film measurements1
    deposition rate1
    end point detectors1
    endpointer1
    end pointer1
    end point systems1
    endpoint systems1
    etch rate1
    thin film monitors1
    Digitwin0
    plasma characterisation0

    www.multisem.com - 2009-02-13

  3. DIGILEM - Interferometric Endpoint Detector & Thin Film Monitor

    Interferometry is a powerful technique that can be used for endpoint detection of planar layer and trench etching, or deposition
    plasma2
    semiconductor2
    semiconductors2
    deposition2
    etch1
    interference1
    Sofie1
    endpoint1
    interferometry1
    film thickness1
    interferometers1
    plasma etch1
    end point1
    dry etching1
    thickness monitors1
    dry etch1
    thin film characterisation1
    end point detection1
    endpoint detection1
    thin film measurements1
    deposition rate1
    end point detectors1
    endpointer1
    end pointer1
    end point systems1
    endpoint systems1
    etch rate1
    thin film monitors1
    Digilem0
    etching control0
    semiconductor characterisation0

    www.digilem.com - 2009-02-08

  4. OPTICS JOURNAL

    Optics Journal Research on optics, laser optics, and laser physics Opt. J. Optics Journals Physics & Astronomy Journals Optics & Physics Societies Tunable ...
    books5
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    physics2
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    newton2
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    dye2
    telescopes2
    prism1
    dispersion1
    duarte1
    interference1
    oscillators1
    prisms1
    gratings1
    diffraction1
    interferometry1
    resonators1
    solid-state1
    tunable1
    dirac1
    interferometers1
    tunable lasers1
    dispersive1
    linewidth1
    dye lasers1
    beam-expanders1
    multiple-prism1

    opticsjournal.com - 2009-04-07

interferometer1 optics2 calibration2 control3 management5 hunting3 measurement2 metrology2 fiber optics2 wireless weather station1 analysis3 inspection3 binoculars2

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