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SPECS, XPS, instrument, system, STM, LT-STM, MBE, ALD, RHEED, nano, bio, LEED, EELS, Auger, ESCA, UPS, SIMS, PEEM, LEEM, Kelvin Probe, VT-STM
Instruments for surface science and UHV components for XPS, LT-STM, MBE, ESCA, LEED, EELS, Auger, UPS, SIMS, PEEM, LEEM, vacuum chambers, effusion cells, ECR ...
science
SEM
material
vacuum
surface
SAM
x-ray
LEED
SPECS
Analyzer
aida
AES
ISS
MBE
spectroscopy
TDS
Auger
STM
XPS
characterization
diffraction
VSI
ESCA
UHV
LEEM
hemispherical
PHOIBOS
XRRS
LT-STM
PEEM
VIDEO-LEED
www.specs.com - 2009-02-07
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