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  1. BIOPHY - Analyse surface

    Surface analysis specialized company (esca, tof-sims, afm, ftir, contact angle, permeation) and plasma treatments (pecvd)
    sims2
    afm1
    xps1
    force measurement1
    surface treatment1
    morphology1
    ftir1
    permeability1
    pecvd1
    esca1
    surface analysis1
    atomic force microscopy1
    glow discharge1
    roughness1
    permeation1
    phase contrast1
    contact angle1
    infrared analysis1
    nanoindentation1
    tof-sims1
    contamination analysis1
    cold plasma1
    plasma activation1
    tofsims1
    atomic composition0
    biophy0
    biophy research0
    bonding composition0
    molecular fragment0
    rugosity0
    tof sims0

    www.biophyresearch.com - 2009-02-07

  2. JEOL (ITALIA) S.p.A.

    JEOL(ITALIA)S.p.A. handles sales and service of JEOL instruments in UK, Ireland and South Africa. JEOL(UK)Ltd. is part of a world community of JEOL subsidiaries ...
    SEM3
    STEM2
    TEM1
    Auger1
    AFM1
    SPM1
    NMR1
    STM1
    ESR1
    GCMS1
    ESCA1
    mass spectrometer1
    electron microscope1
    EBX1
    atomic force microscope1
    scanning electron microscope1
    microprobe1
    scanning probe microscope1
    JEOL1
    EPMA1
    electron beam lithography1
    amino acid analyzer1
    electron probe microanalyzer1
    NMR spectrometer1
    FE-TEM1
    scanning Auger microprobe1
    scanning tunnelling microscope1
    JEOL Italia0
    JEOL ITALIA S.p.A.0
    JEOL Italy0
    JEOL SPA0

    www.jeol.it - 2009-02-09

  3. JEOL (Europe) BV - scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, mass spectrometers, NMR spectrometers,and ...

    HOME ABOUT US NEWS & EVENTS CONTACT US '); document.write(' '); } else if (i == 2) { document.write(' '); document.write(' '); } else if (i == 3) { ...
    SEM3
    STEM2
    TEM1
    Auger1
    AFM1
    SPM1
    NMR1
    STM1
    ESR1
    GCMS1
    ESCA1
    mass spectrometer1
    electron microscope1
    EBX1
    atomic force microscope1
    scanning electron microscope1
    microprobe1
    scanning probe microscope1
    JEOL1
    EPMA1
    electron beam lithography1
    amino acid analyzer1
    electron probe microanalyzer1
    NMR spectrometer1
    FE-TEM1
    scanning Auger microprobe1
    scanning tunnelling microscope1
    JEOL Belgium1
    JEOL Europe B.V.1
    JEOL Holland1
    JEOL The Netherlands1

    www.jeol.nl - 2009-04-11

  4. Caractérisation matériaux

    Caracterisation des matériaux: Localiser un instrument de caractérisation en sélectionnant une technique appropiée pour obtenir les coordonnées d’un laboratoire e ...
    france4
    SEM3
    instruments2
    instrument2
    identification2
    surface2
    laboratoire2
    SIMS2
    AES1
    SQUID1
    TEM1
    appareil1
    AFM1
    labo1
    materiaux1
    laboratoires1
    RAMAN1
    ESCA1
    RMN1
    RPE1
    spectroscopie1
    caractérisation1
    spectrométrie1
    caractérisation des matériaux1
    analyse échantillon0
    caractérisation d'échantillons0
    caractérisation XPS0
    instrument de caractérisation0

    www.sciencefrance.com - 2009-02-13

  5. Rocky Mountain Laboratories, Inc., Surface analysis with Auger, XPS, SEM, EDS, AFM, SIMS, and FTIR

    Rocky Mountain Laboratories, Inc. has been performing Surface and Microanalysis Since 1983. We are an ISO9001 Certified Laboratory. Materials analysis is ...
    research5
    colorado4
    SEM3
    materials3
    ISO2
    20002
    laboratory2
    chemistry2
    troubleshooting2
    SIMS2
    processes2
    ISO90012
    AES1
    failure analysis1
    EDS1
    auger1
    AFM1
    SPM1
    XPS1
    process development1
    FTIR1
    ESCA1
    EDX1
    surface analysis1
    scanning electron microscopy1
    microanalysis1
    EDAX1
    DSIMS1
    SSIMS1

    www.rockymountainlabs.com - 2009-02-07

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