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  1. Foothill Instruments

    Foothill Instruments manufactures thick film metrology systems.
    instrument2
    measurement2
    polymer2
    silicon2
    metrology2
    oxide1
    spectrometer1
    thin film1
    BCB1
    dielectric1
    resist1
    polyimide1
    nitride1
    interferometry1
    photoresist1
    polysilicon1
    thick film1
    uniformity1
    refractive index1
    film thickness1
    ellipsometry1
    reflectivity1
    amorphous silicon1
    low-k1
    spin-on1
    SU-81
    wafer thinning1
    oxynitride1
    backgrind1
    silicide1
    a-silcon0

    www.foothill-instruments.com - 2009-02-06

  2. Filmetrics Thin Film Thickness Measurements, Thin Film Measurements

    Home About Us Technology Spectral Reflectance What We Measure Products Overview F10 F20 F30 F40/F42 F50/F60 F80 Accessories Applications Biomedical Displays ...
    map3
    polymer2
    semiconductor2
    gauge2
    process control2
    measure2
    layer1
    wafer1
    oxide1
    CMP1
    CVD1
    spectrometer1
    in-line1
    in-situ1
    polyimide1
    nitride1
    interferometry1
    photoresist1
    polysilicon1
    thickness measurement1
    uniformity1
    refractive index1
    ellipsometry1
    optical properties1
    thin film measurement1
    optical constants1
    integrated metrology1
    spectral reflectance1
    oxynitride1
    a-silicon1
    defect mapping1

    www.filmetrics-asia.com - 2009-02-13

  3. Filmetrics Thin Film Thickness Measurements, Thin Film Measurements

    Home About Us Technology Spectral Reflectance What We Measure Products Overview F10 F20 F30/F37 F40/F42 F50/F60 F80 Accessories Applications Biomedical Displays ...
    map3
    polymer2
    semiconductor2
    gauge2
    process control2
    measure2
    layer1
    wafer1
    oxide1
    CMP1
    CVD1
    spectrometer1
    in-line1
    in-situ1
    polyimide1
    nitride1
    interferometry1
    photoresist1
    polysilicon1
    thickness measurement1
    uniformity1
    refractive index1
    ellipsometry1
    optical properties1
    thin film measurement1
    optical constants1
    integrated metrology1
    spectral reflectance1
    oxynitride1
    a-silicon1
    defect mapping1

    www.filmetricseuropa.com - 2009-04-02

nitrous1 metal4 metrology2 ford3 optical constants1 steel3 rock4 ellipsometer1 magnesium2 chemicals2 racing3 optical properties1 carbonate1 interferometry1 aluminum3 calcium2 nos2 ellipsometers1

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