Gnomit / Keyword Search / Info
Gnomit ? ? ?
Results 1 - 10 of 13 for:
ellipsometer
1
ellipsometry
1 ?
 21,213,375 websites (safe search)

  1. Axic Inc - Semiconductor Plasma, Rapid Thermal Processing and Thin Film Metrology Equipment Company Homepage

    AXIC, Inc manufactures and distributes semiconductor plasma processing equipment and Thin Film Metrology tools (Ellipsometer, Spectroscopic and Discrete ...
    Asher1
    PECVD1
    Thickness Measurement1
    Plasma etcher1
    refractive index1
    Reflectometer1
    ellipsometer1
    optical measurement1
    LPCVD1
    ellipsometry1
    Plasma etch1
    Spectroscopic Ellipsometry1
    Thin Film Measurement1
    Spectroscopic Ellipsometer1
    Thin Film Metrology1
    Photoresist stripping1
    Reactive ion etch1
    Plasma deposition1
    Rapid thermal annealing1
    Reactive ion etcher1
    Thin Film Analysis1
    Rapid thermal anneal1
    Resist stripper1
    X-ray fluoresence1
    Diode etcher0
    ICP etch0
    ICP etcher0
    ICP PECVD0
    Photoresist stripper0
    Plasma wafer backside thinning0
    Rapid thermal processor0

    www.axic.com - 2009-02-07

  2. Angstrom Sun Technologies Inc: Optical Solutions for Thin Films - Spectroscopic Ellipsometer, reflectometer, microspectrophotometer, microreflectometer with ...

    Angstrom Sun Technologies Inc, a professional company that provides thin film thickness and optical constants measurement systems, including Spectroscopic ...
    coating2
    coating thickness1
    ellipsometer1
    ellipsometry1
    coating inspection1
    coating thickness gauge1
    ellipsometers1
    coating thickness measurement1
    coating thickness gauges1
    coating measurement1
    coating thickness gages1
    coating thickness meter1
    coating inspector1
    coating inspection equipment1
    absorption coefficient1
    coating gauge1
    coating thickness gage1
    elipsometer1
    absorption coefficients1
    coating gage1
    absorbtion coefficients0
    absorption measurement0
    advanced thin films0
    coating gauges0
    coating measurements0
    coating thickness guage0
    coating thickness measurements0
    dielectrical constants0
    dielectric constant database0
    dielectric constants0
    ellipsometric0

    www.angstec.com - 2009-02-08

  3. Angstrom Advanced Inc. - Ellipsometer

    Spectroscopic Ellipsometer, Spectroscopic Ellipsometry, Ellipsometer, Ellipsometry, thin film, coating, thickness measurements, thin film measurement, film ...
    coating2
    thin film1
    dre1
    thickness1
    SWE1
    sopra1
    refractive index1
    Ellipsometer1
    Ellipsometry1
    Spectroscopic1
    JOBIN YVON1
    Spectroscopic Ellipsometry1
    Spectroscopic Ellipsometer1
    thin film thickness1
    extinction coefficient1
    Beaglehole1
    n&k1
    Angstrom Sun0
    Gaetner0
    J.A.Woollam0
    jobinyvon0
    Woollam0

    www.angstromadvanced.com - 2009-02-04

  4. Thin Film Home Page - HORIBA

    Thin Film metrology, ellipsometry and process control
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    thin film1
    in-situ1
    sofie1
    interferometry1
    thin films1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    optical emission spectroscopy1
    multiwavelength ellipsometer1
    real-time process monitoring1
    thin film metrology1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    phase modulated ellipsometer1

    www.ellipsometer.info - 2009-04-04

  5. Thin Film Home Page

    Thin Film metrology, ellipsometry and process control
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    thin film1
    in-situ1
    sofie1
    interferometry1
    thin films1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    optical emission spectroscopy1
    multiwavelength ellipsometer1
    real-time process monitoring1
    thin film metrology1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    phase modulated ellipsometer1

    www.ellipsometry.co.uk - 2009-02-08

  6. Process Control Products from HORIBA Jobin Yvon

    Process Applications of Thin Film
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    thin film1
    in-situ1
    sofie1
    interferometry1
    thin films1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    optical emission spectroscopy1
    multiwavelength ellipsometer1
    real-time process monitoring1
    thin film metrology1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    phase modulated ellipsometer1

    www.jyprocesscontrol.com - 2009-02-07

  7. High End Research Ellipsometer

    UVISEL Ellipsometers
    Delta2
    instrumentation2
    Psi2
    real time2
    metrology2
    rotating1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    ex-situ1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    multiwavelength ellipsometer1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    polarised light1
    phase modulation1
    characterisation of thin film0
    ellipsometric angles0
    fresnel reflection0
    in-situ uvisel ellipsometer0
    real time process monitoring0
    uvisel0

    www.uvisel.com - 2009-02-14

  8. Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with ...

    Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the ...
    index3
    SCI2
    metrology2
    thin film1
    thickness1
    film thickness1
    reflectometer1
    ellipsometer1
    roughness1
    spectrophotometry1
    ellipsometry1
    material analysis1
    optical properties1
    ellipsometers1
    spectroscopic ellipsometry1
    material characterization1
    reflectometry1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    film thickness measurement1
    multiwavelength ellipsometer1
    thin film metrology1
    reflectometers1
    extinction coefficient1
    crystallinity1
    metrology tools1
    multi angle reflectometer1
    spectroscopic reflectometer1
    spectroscopic reflectometry1
    thin film metrology tools0

    www.sci-soft.com - 2009-02-07

  9. Scientific Computing International - FilmTek Instruments

    FilmTek™ 2000SE - Spectroscopic Ellipsometer. Based on a rotating compensator design, the FilmTek™ 2000SE combines spectroscopic ellipsometry with normal inc ...
    index3
    SCI2
    metrology2
    thin film1
    thickness1
    spectrophotometer1
    film thickness1
    reflectometer1
    ellipsometer1
    roughness1
    spectrophotometry1
    ellipsometry1
    material analysis1
    optical properties1
    ellipsometers1
    spectroscopic ellipsometry1
    material characterization1
    reflectometry1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    film thickness measurement1
    multiwavelength ellipsometer1
    thin film metrology1
    reflectometers1
    extinction coefficient1
    crystallinity1
    metrology tools1
    multi angle reflectometer1
    spectroscopic reflectometer1
    spectroscopic reflectometry1

    www.sciinstruments.com - 2009-02-07

  10. PlasmaScope from HORIBA Jobin Yvon

    PlasmaScope, portable multichannel optical emission spectrometer with advanced end point
    portable3
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    oes1
    multichannel1
    endpoint1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    multiwavelength ellipsometer1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    end point detection1
    optical emission spectrometer0
    plasma chemical composition0
    plasma diagnosis0
    plasmascope0
    reactive species0

    www.plasmascope.com - 2009-02-06

12 Next>

Gnomit  
About Gnomit
Keywords may contain spaces.
Separate multiple keywords with commas.
Start a new search.
Enter new keyword(s).
Narrow down your search.
Add keyword(s).
Broaden your search.
Click on Keyword to remove from query.