Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the ...
FilmTek™ 2000SE - Spectroscopic Ellipsometer. Based on a rotating compensator design, the FilmTek™ 2000SE combines spectroscopic ellipsometry with normal inc ...
HORIBA Jobin Yvon ellipsometers combine two key elements: phase modulation and an entirely numerical data acquisition and processing system. It allows real-time ...