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  1. DFT Digest: Expanding design-for-test in an ever-shring world…

    Design for test, Design-for-Test (DFT) discussion, education, and best-practices, including Scan, ATPG, BIST, Memory BIST, Logic BIST, Test Compression, ...
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    www.dftdigest.com - 2009-02-08

  2. Testviewz.com

    Testviewz.com is a website related to manufacturing test and diagnosis of digital integrated circuit devices. The site features technical material authored or ...
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    Design-For-Testability1
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    At-Speed Test1
    Cadence Design Systems1
    ICCAD1
    transition fault1
    Delay Test0
    OPMISR0
    SmartBIST0
    stuck-at fault0
    stuck fault0
    Test Data Compression0

    www.testviewz.com - 2009-02-09

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